FLUCTUATION PROCESSES IN VALIABLE – CAPACITANCE DIODES

Abstract

Possibilities and physical principles for determination of methods of a rejection of unreliable varicaps by their noise characteristics are considered. The basic theoretical relations which define their parametres are reduced. The physical base of a method of a failure prediction of varicaps on their low- frequency noises is association of noise level on presence of imperfections of structure and quality of contacts of a hardware product is shown. High level of an internal noise of instruments has the information on presence of those or other imperfections.